Jon sent in this website which also claims anomalous cooling in an
electronic circuit that apparently had o/u effects. They later said the
effect was disproven and that the circuits showed anomalies that were
not consistent...one of the problems with 'free energy' devices...so
far...
http://www.atgroup.org/ecat.htm
During empirical work on "BiPEG", certain anomalous measurements were
made, of which a decrease in temperature was most interesting. This
temperature decrease was measured across the solid state device
(transistor) being used in the "BiPEG" generator and was observed only
under specific current and voltage phase conditions of the "BiPEG" self
generated oscillation.
"BiPEG" itself provided numerous problems in repeatability and stability
because of the self generated oscillations which were a result of
specific coil geometry's and parameters such as inter-winding capacity
and self resonance frequencies.
Many months of work did finally allow for the development of a
repeatable and marginally stable test unit from which valuable
measurements were taken.
With this test unit we observed a marked decrease in transistor
temperature of from (1’ to 2’) degrees Celsius below ambient, during
periods when (POut/PIn > 1.0).
For many months it was felt that even though the transistor exhibited
this anomalous temperature that the conditions which allowed (POut/PIn >
1.0) was some how a manifestation of the coils (parametric effect)
rather that the solid state device itself.
This was later disproved and the focus then centered on the transistor.
Continued testing, measurement and component substitution provided a
road map on how the condition could be manifested in almost all NPN
transistors (high current power transistors exclued), provided that the
correct voltages and phases of applied signals are held within a
specific range and phase angle for a specific period of time on each of
the three leads of the transistor (B,E and C).
As stated earlier these conditions were somewhat random and varied
greatly with the coils and other components used in the "BiPEG" test
circuits.
-- Jerry Wayne Decker / jdecker@keelynet.com http://keelynet.com / "From an Art to a Science" Voice : (214) 324-8741 / FAX : (214) 324-3501 KeelyNet - PO BOX 870716 - Mesquite - Republic of Texas - 75187